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Leica

ID MODEL DESCRIPTION
419022 LEI2000 Microscope Microscope
419023 LEI2000 Microscope Microscope
421048 Cambridge S260 Leica Cambridge S260 Leica Cambridge S260
130146 INS 2000 Defect Review System Defect Review System
132433 INS-3000 Dual Wafer Defect Inspection Wafer Defect Inspection
132434 INS-3000 Wafer Defect Inspection Wafer Defect Inspection
132435 INS-3000 Wafer Defect Inspection Wafer Defect Inspection
132436 INS-3000 Wafer Defect Inspection Wafer Defect Inspection
132437 INS-3000 Wafer Defect Inspection Wafer Defect Inspection
132438 INS-3000 Wafer Defect Inspection Wafer Defect Inspection
132439 INS-3000(Dual) Wafer Defect Inspection Wafer Defect Inspection
132440 INM100 Operation Manual Optical Microscope Operation Manual Optical Microscope
132441 INM100 Operation Manual Optical Microscope Operation Manual Optical Microscope
132442 Polyver SC POLYVAR SCOPE POLYVAR SCOPE
132443 Polyver SC POLYVAR SCOPE POLYVAR SCOPE
132444 MIS 200 Wafer Inspection Microscope Wafer Inspection Microscope
132445 LEICA AG AUTO SCOPE AUTO SCOPE
132446 Reichert-Jung MeF3A MICRO SCOPE MICRO SCOPE
132447 Reichert-Jung POLYVAR SC Wafer Inspection Microscope Wafer Inspection Microscope
132448 Reichert POLYVAR SC Wafer Inspection Microscope Wafer Inspection Microscope
132449 Reichert POLYVAR SC Wafer Inspection Microscope Wafer Inspection Microscope
132450 Reichert-Jung Kensington 300901 Wafer Inspection Microscope Wafer Inspection Microscope
132451 Reichert-Jung Kensington 300901 Wafer Inspection Microscope Wafer Inspection Microscope
132452 Reichert-Jung Kensington 300901 Wafer Inspection Microscope Wafer Inspection Microscope
132453 Reichert-Jung Kensington 300901 Wafer Inspection Microscope Wafer Inspection Microscope
132454 Reichert-Jung Kensington 300901 Wafer Inspection Microscope Wafer Inspection Microscope