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Nanometrics Inc.

ID MODEL DESCRIPTION
132082 LYNX Critical Dimension (CD) Measurement (non SEM) Critical Dimension (CD) Measurement (non SEM)
132083 LYNX Critical Dimension (CD) Measurement (non SEM) Critical Dimension (CD) Measurement (non SEM)
132195 Atlas Film Thickness Measurement System Film Thickness Measurement System
132196 Atlas Film Thickness Measurement System Film Thickness Measurement System
132197 Atlas Film Thickness Measurement System Film Thickness Measurement System
132198 Atlas Film Thickness Measurement System Film Thickness Measurement System
132403 Trajectory T3 Film Thickness Measurement System Film Thickness Measurement System