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Nanometrics Inc.

ID MODEL DESCRIPTION
111354 LYNX Critical Dimension (CD) Measurement (non SEM) Critical Dimension (CD) Measurement (non SEM)
111355 LYNX Critical Dimension (CD) Measurement (non SEM) Critical Dimension (CD) Measurement (non SEM)
111356 Tevet Trajectory T3 Film Thickness Measurement System Film Thickness Measurement System
111357 LYNX Critical Dimension (CD) Measurement (non SEM) Critical Dimension (CD) Measurement (non SEM)
111358 Tevet Trajectory T3 Film Thickness Measurement System Film Thickness Measurement System