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NANOMETRICS

ID MODEL DESCRIPTION
130172 Nanoline CD-50 CD Measurement Tool CD Measurement Tool
130173 Nanospec 2100 Film Thickness Measurement System with 125mm/150mm Dual Wafer Sliding Stage Film Thickness Measurement System with 125mm/150mm Dual Wafer Sliding Stage
130174 Nanospec/AFT 4000 Scanning UV Film Thickness Tool Scanning UV Film Thickness Tool
132483 CALIPER MOSAIC Call for details Call for details
132484 7000-0560 Servo positioning controller Servo positioning controller
132485 9-7200-0195E Mask & Wafer Inspection Mask & Wafer Inspection
132486 Q230 Overlay Overlay
132487 NANOSPEC ATF210 MARK-NANOMETRICS Film Thickness Measurement Film Thickness Measurement