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NIKON

ID MODEL DESCRIPTION
130196 Optiphot Wafer Inspection Microscope Wafer Inspection Microscope
130197 Optiphot 150 Wafer Inspection Microscope 10X 20X 50X & 150X Objectives 150mm XY Stage Wafer Inspection Microscope 10X 20X 50X & 150X Objectives 150mm XY Stage
130198 Optiphot 200 Wafer Inspection Microscope (Parts Tool Only) Wafer Inspection Microscope (Parts Tool Only)
130199 Optistation 2A Automatic Wafer Inspection Systems for 75mm- 150mm Wafers Auto Focus 4ea Avail. Automatic Wafer Inspection Systems for 75mm- 150mm Wafers Auto Focus 4ea Avail.
130200 Optistation 3 Automatic Wafer Inspection Systems for 150mm Wafers 3ea Avail. Automatic Wafer Inspection Systems for 150mm Wafers 3ea Avail.
130201 Optistation 3A Automatic Wafer Inspection Station for 150mm Wafers Automatic Wafer Inspection Station for 150mm Wafers
130202 V-12 Optical Comparator Optical Comparator
132490 3 OPTI station OPTI station
132491 3 OPTI station OPTI station
132492 3A OPTI station OPTI station
132493 NSR-204B Scanner Scanner
132494 NSR-204B Scanner Scanner
132495 NSR-204B Scanner Scanner
132496 NSR-204B Scanner Scanner
132497 NSR-204B Scanner Scanner
132498 NSR-2205EX12B Scanner Scanner
132499 NSR-2205i12C Scanner Scanner
132500 NSR 4425i Stepper part machine Stepper part machine
132501 NSR 4425i Stepper Stepper
132502 NSR 4425i Stepper Stepper
132503 NSR 4425i Stepper Stepper
132504 NSR 4425i Stepper Stepper
132505 Optiphoto2 OPTICAL MICROSCOPE OPTICAL MICROSCOPE
132506 OPTISTATION INSPECTION MICRO SCOPE INSPECTION MICRO SCOPE
132507 SMZ-U ZOOM MICRO SCOPE MICRO SCOPE
134048 AMI-3500 Macro-Defect Macro-Defect
134049 AMI-3300 Macro-Defect Macro-Defect
134050 AMI-3300 Macro-Defect Macro-Defect
501034 NSR-2205EX14C Inline tool Inline tool